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There is a quite important difference between silver thicknesses measured by HFS and GALION, meanly due to the method. Indeed, HFS’ silver thicknesses are carried out by micrographic cuts (on cross-sections) and GALION thanks to X-ray fluorescence on “flat” surface I assume.
Hopefully, HFS does measure again by another method during incoming inspection.
This is just something to point out and this is not blocking.
Best regards.